引用本文:王新春,周华良,郑立亮,夏雨,甘云华,周辉.就地化保护装置跌落冲击载荷下的可靠性分析[J].包装工程,2019,40(13):160-165.
【打印本页】   【下载PDF全文】   查看/发表评论  【EndNote】   【RefMan】   【BibTex】
←前一篇|后一篇→ 过刊浏览    高级检索
本文已被:浏览 2528次   下载 1501 本文二维码信息
码上扫一扫!
分享到: 微信 更多
就地化保护装置跌落冲击载荷下的可靠性分析
王新春1,2, 周华良1,2,3, 郑立亮1,2, 夏雨1,2, 甘云华1,2, 周辉1,2
1.南瑞集团(国网电力科学研究院)有限公司,南京 211106;2.国电南瑞科技股份有限公司,南京 211106;3.智能电网保护和运行控制国家重点实验室,南京 211106
摘要:
目的 为了评估就地化保护装置跌落冲击载荷下的失效情况。方法 基于显式动力学理论,采用有限元法对就地化保护装置进行跌落冲击的建模仿真。分析PCB板变形与焊点失效之间的关系,探讨元件封装方式对产品抗跌落冲击性能的影响,提出以Von Mises准则得到的焊点最大应力联合跌落寿命模型,进行元件封装可靠性评估的分析方法。针对元件不同封装方式的装置进行跌落验证试验。结果 就地化保护装置跌落冲击仿真结果与试验结果基本吻合。结论 验证了评估元件封装失效分析方法的准确性,为推断产品可靠性提供了理论支撑。
关键词:  就地化保护装置  跌落冲击  可靠性  有限元
DOI:10.19554/j.cnki.1001-3563.2019.13.023
分类号:TB482.2;TB487
基金项目:
Reliability Analysis of In-situ Protection Devices under Drop Impact Loading
WANG Xin-chun1,2, ZHOU Hua-liang1,2,3, ZHENG Li-liang1,2, XIA Yu1,2, GAN Yun-hua1,2, ZHOU Hui1,2
1.NARI Group Corporation State Grid Electric Power Research Institute, Nanjing 211106, China;2.NARI Technology Co., Ltd., Nanjing 211106, China;3.State Key Laboratory of Smart Grid Protection and Control, Nanjing 211106, China
Abstract:
The paper aims to explore the reliability of in-situ protective devices under drop impact load. Based on explicit dynamics theory, the finite element method (FEM) was used to simulate the drop impact of in-situ protective devices. The relationship between PCB plate deformation and solder joint failure was analyzed, and the influence of component encapsulation on drop impact resistance of products was discussed. An analytical method for evaluating component encapsulation failure was proposed based on maximum stress on Von Mises and life prediction model. Drop tests were carried out for different encapsulation modes of components. The results show that the simulation results of drop impact of in-situ protective devices were basically consistent with the experimental data. The accuracy of failure analysis method for component encapsulation is verified, providing theoretical support for inferring product reliability.
Key words:  in-situ protection device  drop impact  reliability  FEM

关于我们 | 联系我们 | 投诉建议 | 隐私保护

您是第24463773位访问者    渝ICP备15012534号-2

版权所有:《包装工程》编辑部 2014 All Rights Reserved

邮编:400039 电话:023—68792836传真:023—68792396 Email: designartj@126.com

    

  
 

渝公网安备 50010702501717号